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Phase retrieval restores resolution to phase images
All X-ray images contain both absorption and phase contrast information. Both types of image data supply information about structures within the sample under investigation. Phase retrieval aims to extract the phase or the phase and amplitude distribution of X-rays immediately after they pass through the sample.
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Location of cometary dust particles in Aerogel
XRT Limited has been working in collaboration with the Stardust team at the Institute for Geophysics and Planetary Physics, Lawrence Livermore National Labs to study cosmic dust particles captured in aerogel using x-ray phase contrast microscopy. This work will be continued on actual cometary dust particles brought back in the Stardust spacecraft which has just returned to earth.
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Fault isolation and failure analysis in semiconductor manufacturing: Within-die delamination and cracking
High resolution phase contrast X-ray imaging can help to detect faults and analyse failures within semiconductor devices. Here we show an example of imaging within-die delamination and cracking.
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Fault isolation and failure analysis in semiconductor manufacturing: Failure of flip-chip packaging
High resolution phase contrast X-ray imaging can help to detect faults and analyse failures within semiconductor devices by revealing failure of flip-chip packaging.
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Fault isolation and failure in semiconductor manufacturing: Electromigration failure analysis
Voiding in component interconnects is a significant source of failure in semiconductor devices.
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Towards 50nm resolution with an X-ray microscope
Advances in technology make ~50nm spatial resolution possible for the first time.
