skip to content
|
skip to primary navigation
|
skip to secondary navigation
News and Events
News Archive...
No archive items here yet
About Us
Our People
Japanese Company Profile
Our Products
X-Ray Ultramicroscope
X-AMIN PCX
Custom Systems
X-TRACT V3
Technology Licensing and Custom Application Solutions
Our Products in Japanese
Technical Information
Phase and Absorption Imaging
Capturing Phase Data
Enhanced Imaging Outcomes
Patents
History
Part 1. A new kind of ray
Part 2. New branches of science
Part 3. Imaging
The Help Files
Contrast Transfer Function
Tomography
X-Rays at Work
Stardust (PDF) 877KB
Delamination (PDF) 575KB
Flip-Chip (PDF) 290KB
EMFA (PDF) 662KB
50nm Resolution (JPEG) 1360KB
Phase Retreval
News & Events
News Archive
Contact us
Privacy Policy
Search
